A. A. Banishev, C. -C. Chang, R. Castillo-Garza, G. L. Klimchitskaya, V. M. Mostepanenko, U. Mohideen
We present complete results of the experiment on measuring the Casimir force
between an Au-coated sphere and an untreated or, alternatively, UV-treated
indium tin oxide film deposited on a quartz substrate. Measurements were
performed using an atomic force microscope in a high vacuum chamber. The
measurement system was calibrated electrostatically. Special analysis of the
systematic deviations is performed, and respective corrections in the
calibration parameters are introduced. The corrected parameters are free from
anomalies discussed in the literature. The experimental data for the Casimir
force from two measurement sets for both untreated and UV-treated samples are
presented. The experimental errors are determined at a 95% confidence level. It
is demonstrated that the UV treatment of an I TO plate results in a significant
decrease in the magnitude of the Casimir force (from 21% to 35% depending on
separation). However, ellipsometry measurements of the imaginary parts of
dielectric permittivities of the untreated and UV-treated samples did not
reveal any significant differences. The experimental data are compared with
computations in the framework of the Lifshitz theory. It is found that the data
for the untreated sample are in a very good agreement with theoretical results
taking into account the free charge carriers in an ITO film. For the UV-treated
sample the data exclude the theoretical results obtained with account of free
charge carriers. These data are in a very good agreement with computations
disregarding the contribution of free carriers. According to the explanation
provided, this is caused by the phase transition of the ITO film from metallic
to dielectric state caused by the UV treatment. Possible applications of the
discovered phenomenon in nanotechnology are discussed.
View original:
http://arxiv.org/abs/1201.5585
No comments:
Post a Comment