Aina M. M. Ghazali, Audun N. Bugge, Sebastien Sauge, Vadim Makarov
We report an automated characterization of a single-photon detector based on
commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode
is characterized by I-V curves at different illumination levels (darkness, 10
pW and 10 uW), dark count rate and photon detection efficiency at different
bias voltages. The automated characterization routine is implemented in C++
running on a Linux computer.
View original:
http://arxiv.org/abs/1202.1591
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