1210.6098 (Zeng-Zhao Li et al.)

Charge-detector-induced backaction and full counting statistics of
transport through a double quantum dot    [PDF]

Zeng-Zhao Li, Chi-Hang Lam, Ting Yu, J. Q. You

Full counting statistics (FCS) of electron transport is of fundamental importance for a deeper understanding of the underlying physical processes in quantum transport in nanoscale devices. Here we investigate the backaction of a charge detector in the form of a quantum point contact (QPC) on the FCS of a biased double quantum dot (DQD). We show that this inevitable QPC-induced backaction can have profound effects on the FCS under certain conditions, namely enhancing current flow through the DQD, and changing the shot noise from being sub-Poissonian to super-Poissonian.

View original: http://arxiv.org/abs/1210.6098