Tuesday, January 29, 2013

1301.6631 (A. A. Banishev et al.)

Measuring the Casimir force gradient from graphene on a SiO_2 substrate    [PDF]

A. A. Banishev, H. Wen, J. Xu, R. K. Kawakami, G. L. Klimchitskaya, V. M. Mostepanenko, U. Mohideen
The gradient of the Casimir force between a Si-SiO${}_2$-graphene substrate and an Au-coated sphere is measured by means of a dynamic atomic force microscope operated in the frequency shift technique. It is shown that the presence of graphene leads to up to 9% increase in the force gradient at the shortest separation considered. This is in qualitative agreement with the predictions of an additive theory using the Dirac model of graphene.
View original: http://arxiv.org/abs/1301.6631

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