Jean-Charles Forgues, Fatou Bintou Sane, Simon Blanchard, Lafe Spietz, Christian Lupien, Bertrand Reulet
We report measurements of the correlation between intensities of noise at different frequencies on a tunnel junction under ac excitation, which corresponds to two-mode intensity correlations in optics. We observe positive correlation, \emph{i.e.} photon bunching, which exist only for certain relations between the excitation frequency and the two detection frequencies, depending on the dc bias of the sample. We demonstrate that these correlations are proportional to the fourth cumulant of current fluctuations.
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http://arxiv.org/abs/1302.6509
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