Ruifeng Liu, Pei Zhang, Yu Zhou, Hong Gao, Fuli Li
Sub-wavelength interference has a potential application in lithography to beat the classical Rayleigh limit of resolution. We carefully study the second-order correlation theory and find there is a bubble of sub-wavelength interference in photon coincidence detection. A Young's double-slit experiment with thermal light is carried out to test the second-order correlation pattern. The result shows that when different scanning ways of two point detectors are chosen, we can get arbitrary-wavelength interference patterns. We then give a theoretical explanation to this surprising result, and find this explanation is also suitable for the result by using entangled light. Furthermore, the question of whether this kind of arbitrary-wavelength interference patterns can be used in quantum lithography is also analyzed.
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http://arxiv.org/abs/1306.0276
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